Associate Professor Jeffrey Herrmann (ME/ISR) and his student Timothy W. Hoy are the recipients of the Institute of Environmental Sciences and Technology's (IEST) 2009 Maurice Simpson Technical Editors Award.
The award is presented to the authors of the best technical papers published by the IEST during the preceding year. One award is presented for each technical division. The pair were honored for their paper, "Optimal Utilization of Test Facilities to Replicate Operational Environments," published in the 2008 Journal of the IEST. They will receive the award at the Membership Meeting and Awards Luncheon on May 6 at ESTECH 2009 in Schaumburg, Ill.
IEST is an international professional society representing interests in contamination control; design, test and evaluation; and product reliability.
February 24, 2009